X-Ray Diffractometer (XRD)
X’Pert MRD diffractomer from PANalytical with Euler cradle. Ideal for measurement of residual stresses and crystallographic texture. Horizontal diffactometer with both Bragg-Brentano and parallel beam optics. Max. weight 500 g, max. height 24 mm. Two radiations available, Cu and Cr. Possibility of thin films characterization by Grazing Incidence X-Ray Diffraction. Software HIGH SCORE for phase identification; STRESS and TEXTURE for residual stresses and texture analysis, respectively. Indispensable technique for analysis and characterization of a wide range of materials.
X’Pert MRD diffractometer with Euler cradle, Cu radiation, Bragg-brentano optics, cross-slit collimator, programable receiving slit, Xe proportional detector, softwares Data Collector”, PC-STRESS and PC-TEXTURE
Parallel beam optics (pollicapilar lens, parallel plate collimator, graphite flat monochromator). Small angle slits for Grazing Incidence X-Ray Diffraction.
Quantification of fraction of retained austenite in steels
Phase identification and quantification by conventional and grazing incidence in different materials and thin films. Quantification of crystallite size and micro-stresses.
Measurement of residual stresses
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