NAME Surface Analysis Unit

DESCRIPTION

Multi Technique UHV Surface Analysis System for XPS, AES, SEM/SAM, ISS and depth profiling with high space and energy resolution on the different types of conducting and non conducting samples. With the possibility of modifying the material surface and performing electrochemical processes.

FIELDS OF APPLICATION

Coatings and Surfaces solutions

Design and development of materials

Manufacturing processes

MOST OUTSTANDING EQUIPMENT AND COMPONENTS

  • Multitechnique Surface Analysis System

    This platform will allow for the characterization of the surface and interface of materials with high resolution in terms of composition and morphology. It is an ultra high vacuum system that integrates several surface and interface characterisation techniques such as photo emission spectroscopy (XPS, UPS), ion scattering spectroscopy and spectroscopies with lateral resolution providing imaging capability (SEM/SAM). The system has a preparation stage to modify the surface of samples under study, as well as preparations under high pressure conditions and electrochemical processes.

SERVICES OFFERED BY THE ASSET

High pressure and temperature modification of materials

Material modification in controlled environment up to 20 bar and 800 °C

Modification of outermost surface of materials

Surface modification by means of coating deposition or ion etching.

Surface analysis of electrochemically cycled materials

Surface analysis of materials after electrochemical cycling under controlled atmosphere or vacuum (~10-5 mbar).

Surface chemical composition determination

Determination of chemical composition of the material surface and subsurface with depth profiling and imaging capabilities (lateral resolution from 500 nm to 1000 nm).

ENTITY MANAGING THE ASSET

ENTITY MANAGING THE ASSET
CIC energiGUNE
Contact person:
Leire Olaeta Rodríguez
lolaeta@cicenergigune.com