Surface Analysis Unit
Multi Technique UHV Surface Analysis System for XPS, AES, SEM/SAM, ISS and depth profiling with high space and energy resolution on the different types of conducting and non conducting samples. With the possibility of modifying the material surface and performing electrochemical processes.
This platform will allow for the characterization of the surface and interface of materials with high resolution in terms of composition and morphology. It is an ultra high vacuum system that integrates several surface and interface characterisation techniques such as photo emission spectroscopy (XPS, UPS), ion scattering spectroscopy and spectroscopies with lateral resolution providing imaging capability (SEM/SAM). The system has a preparation stage to modify the surface of samples under study, as well as preparations under high pressure conditions and electrochemical processes.
High pressure and temperature modification of materials
Modification of outermost surface of materials
Surface analysis of electrochemically cycled materials
Surface chemical composition determination
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