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NAME

Dual Beam FEG-SEM FIB

DESCRIPTION

DualBeam QUANTA3DFEG equipment from FEI. It has a high-resolution scanning electron microscope (~1nm) and a Gallium ion cannon that allows the deposition and ablation of material. In addition, there has been developed an image analysis software that allows to solve the residual stresses from the images obtained from FEGSEM before and after FIB milling in a range of scales from 1 um to 800 um and 0.5 - 50 um depth.

MOST OUTSTANDING EQUIPMENT AND COMPONENTS

DualBeam QUANTA3DFEG +

DualBeam QUANTA3DFEG equipment from FEI. It has a high-resolution scanning electron microscope (~1nm) and a Gallium ion cannon that allows the deposition and ablation of material.

Digital Image Correlation software developed by CEIT-IK4 in MATLAB +

CEIT-iK4 has developed an image analysis software that allows to solve the residual stresses from the images obtained from FEGSEM before and after FIB milling in a range of scales from 1 um to 800 um and 0.5 - 50 um depth.

SERVICES OFFERED BY THE ASSET

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357

Measurement of residual stress profiled across welding and HAZ

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349

Measurement of the distribution of residual stresses along a machined surface

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347

Measurement of stress profiles in depth of machined surfaces

ENTITY MANAGING THE ASSET

CEIT-IK4

Manuel Lardizabal, 15

20018 DONOSTIA-SAN SEBASTIÁN, GIPUZKOA

Contact person:

Jon Alkorta

jalkorta@ceit.es

imprimir Dual Beam FEG-SEM FIB" class="envelope">

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