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NAME

Surface Analysis Unit

DESCRIPTION

Multi Technique UHV Surface Analysis System for XPS, AES, SEM/SAM, ISS and depth profiling with high space and energy resolution on the different types of conducting and non conducting samples. With the possibility of modifying the material surface and performing electrochemical processes.

MOST OUTSTANDING EQUIPMENT AND COMPONENTS

Multitechnique Surface Analysis System +

This platform will allow for the characterization of the surface and interface of materials with high resolution in terms of composition and morphology. It is an ultra high vacuum system that integrates several surface and interface characterisation techniques such as photo emission spectroscopy (XPS, UPS), ion scattering spectroscopy and spectroscopies with lateral resolution providing imaging capability (SEM/SAM). The system has a preparation stage to modify the surface of samples under study, as well as preparations under high pressure conditions and electrochemical processes.

SERVICES OFFERED BY THE ASSET

ENTITY MANAGING THE ASSET

CIC energiGUNE

,

Contact person:

Leire Olaeta Rodríguez

lolaeta@cicenergigune.com

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